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Radiation-induced change of OH content in Yb-doped silica glass 被引量:4

Radiation-induced change of OH content in Yb-doped silica glass
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摘要 Yb-doped silica glasses containing low, medium, and high content of OH arc prepared through nanoporous glass sintering technology. High-OH sample exhibits better X-ray irradiation resistivity than low- and medium-OH samples. After irradiation, OH content of low- and medium-OH samples increases 37.5% and 11%, respectively; in contrast, OH content of high-OH sample decreases dramatically. The different OH content changes among the samples are discussed regarding the proposed inter-conversion reactions involving Si-H and Si-OH during the irradiation. Yb-doped silica glasses containing low, medium, and high content of OH arc prepared through nanoporous glass sintering technology. High-OH sample exhibits better X-ray irradiation resistivity than low- and medium-OH samples. After irradiation, OH content of low- and medium-OH samples increases 37.5% and 11%, respectively; in contrast, OH content of high-OH sample decreases dramatically. The different OH content changes among the samples are discussed regarding the proposed inter-conversion reactions involving Si-H and Si-OH during the irradiation.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2015年第6期5-8,共4页 中国光学快报(英文版)
基金 supported by the National Natural Science Foundation of China under Grant Nos.51272262 and61405215
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