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A digital CDS technique and its performance testing 被引量:1

A digital CDS technique and its performance testing
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摘要 Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique. Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique.
出处 《Chinese Physics C》 SCIE CAS CSCD 2015年第7期48-52,共5页 中国物理C(英文版)
基金 Supported by National Natural Science Foundation of China(10978002)
关键词 charge-coupled devices readout noise correlated double sampling charge-coupled devices,readout noise,correlated double sampling
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