摘要
针对无专用测试接口的设备进行TPS测试时单个现场可更换单元故障隔离率低的问题,采用测试信号并行引出技术,开发现场可更换单元的测试适配板等测试硬件,将现场可更换单元的测试信号并行引出到自动测试设备进行测试分析,高可靠地实现了单个现场可更换单元的故障隔离;同时对信号并行引出带来的测试信号失真问题,在测试程序中采用动态库数据解析技术,提高了测试信号参数解析的准确率。
According to the problem of low fault isolation rate for single line replaceable unit (LRU) during test program set (TPS) testing of the equipment without special test interface, test signal parallel extraction technology is adopted. Test hardware such as test adaptation module of LRU is developed. The test signal from LRU is parallel extracted to automatic test equipment to perform test analysis, and signal LRU fault isolation is reliably realized, while the problem of test signal distortion from signal parallel is solved using dynamic library data analytic technology in test programs. And the accuracy of test signal parameter analytic is improved.
出处
《光电技术应用》
2015年第3期45-48,61,66,共6页
Electro-Optic Technology Application