基于Volterra核二次型分布的非线性模拟电路软故障诊断

Diagnosis of soft fault in nonlinear analog circuits based on 2nd-order distribution of Volterra kernel

针对非线性模拟电路软故障诊断的难题,基于Volterra核二次型分布—–Wigner Ville分布(WVD),提出一种故障特征提取的新方法.首先计算待测试电路(CUT)的Volterra核;然后对该Volterra核进行WVD转换,得到WVD函数,从中提取出故障特征,完成非线性模拟电路的软故障诊断.仿真实验结果表明,该方法能有效地解决故障混叠难题,提升故障元件检测和定位的能力.

Aiming at the problem of soft fault diagnosis of nonlinear analog circuits, a novel approach of fault signature extraction is proposed based on the 2nd-order distribution—Wigner Ville distribution（WVD） of the Volterra kernel. Firstly, the Volterra kernel of the circuit under test（CUT） is calculated. Then the Volterra kernel of the CUT is transformed based on the WVD and the WVD functions are obtained. In the WVD functions, the fault signatures are extracted and the soft fault diagnosis of the nonlinear analog circuit is achieved. The simulation results show that the proposed method can solve the fault aliasing problem effectively and improve the capability of detecting and locating fault components.