一种集成电路芯片测试分选机的设计

The Design of Testing Sorter Based on Integrated Circuit Chip

设计了一种转塔式测试分选机,用于极小型半导体器件的测试、打标、分选和编带。此设备处理速度快,检测分选效率高,对半导体器件损伤小,可以大规模用于极小型半导体器件的测试分选。

A turret testing sorter was designed for testing, marking, sorting and braiding of mini-semiconductor devices. This sorter enjoyed a fast handling speed and high efficiency in testing and sorting,and did little damage to the semiconductor devices,which made it extensively applicable for testing and sorting of mini-semiconductor devices.