光学干涉在二次电光系数测量中的应用与分析

APPLICATION AND ANALYSIS OF THE OPTICAL INTERFERENCE IN THE QUADRATIC ELECTRO-OPTIC COEFFICIENT MEASUREMENT

为了更加深入地掌握光学干涉原理以及晶体材料的电光效应,我们搭建了利用干涉原理的典型光学系统——马赫-曾德尔电光系数干涉测量系统.首先,结合光学干涉原理和晶体材料的二次电光效应,进行了详细的理论推导,证明了测量方法的正确性和可行性.之后,以钽铌酸钾钠(KNTN)晶体作为研究对象,在实验中测量得到了其二次电光系数s11为2.28×10-15 m2·V-2.在此过程中,通过对马赫-曾德尔光学干涉测量系统的理论剖析与实际应用,相信可以帮助同学们更深入地理解和掌握光学干涉、晶体折射率及其电光效应的本质与原理.

In order to further understand the interference and the electro-optic effect, we set up a typical optical system based on the theory of the interference, which is the Mach-Zehnder interferometry measurement system of the electro-optic coefficients. Firstly, the detailed theo- retical derivation has been carried out based on the combination of optical interference principle and the quadratic electro-optic effect of crystalline materials. The derivation prove the validity and the feasibility of the measurement. Then, the quadratic electro-optic coefficient was ob- tained in the experiment, with regarding the potassium sodium tantalum niobate （KNTN） crystal as the research object, and the Sll reaches 2.28X 10-is mz ~ V-z. During this process, it can help students further understand and grasp the nature and the principle of theoretical in- terference, the refractive index of crystals, and the electro-optic effect, through the analysis and application of the Mach-Zehnder optical interferometry system.