重金属铜胁迫玉米叶片的光谱响应特征

Spectral Response Characteristics of Corn Leaves under Copper Stress

为研究玉米叶片的反射光谱特征在受重金属铜胁迫时发生的变化,通过玉米铜胁迫种植试验,分析不同浓度铜胁迫对玉米叶片叶绿素及铜含量的影响,同时根据12个特征波段及其归一化植被指数、光谱角及作者提出的光谱差之和与光谱差均值描述铜胁迫叶片的光谱特征。结果表明:随着土壤中Cu2+浓度升高,玉米叶片铜含量逐渐增加,叶绿素含量逐渐降低;可采用光谱特征波段、归一化植被指数、光谱角、光谱差之和与光谱差均值的方法识别铜胁迫玉米叶片和健康玉米叶片之间的光谱差异。

The effect of different Cu^2＋ stress on chlorophyll and Cu content of corn leaves was analyzed and spectral characteristics of corn leaves under Cu^2＋stress was described by the suggested sum of spectral difference and mean value of spectral difference according to 12 characteristic waveband,normalized differential vegetation index and spectral angle to study reflectance spectral characteristics of corn leaves under Cu^2＋stress.The results showed that Cu content of corn leaves increases but chlorophyll content of corn leaves decreases gradually with increase of Cu^2＋concentration in soil.The spectral difference between corn leaves under Cu^2＋stress and health corn leaves can be identified by methods of spectral characteristic waveband,normalized differential vegetation index,spectral angle,sum of spectral difference and mean value of spectral difference.