摘要
本文以POSS/环氧树脂的二元体系为主体,研究了电子束辐照对该二元体系在透射电镜观察中的作用。研究表明,随着电子束辐照强度和辐照时间的增加,二元体系中POSS分散相的衬度越来越明显,得到的TEM图像也更加清晰。本文采用TEM图像的相对灰度值定量研究了电子束辐照时间对图像清晰度的影响,探索了电子束辐照对该二元体系TEM像衬度提高的原理。
In this paper, the role of electron irradiation in TEM observation was investigated using POSS/epoxy resin as an example. The results show that the contract of POSS in this binary system increases with the electron irradiation intensity and the irradiation time. Using the electron irradiation, clearer TEM photo can be obtained. The relative grey value is employed for quantitative analysis. The mechanism of electron-beam irradiation is also presumed.
出处
《电子显微学报》
CAS
CSCD
2015年第3期200-204,共5页
Journal of Chinese Electron Microscopy Society
基金
国家自然科学基金资助项目(No.50730008)
关键词
电子束辐照
有机/无机二元体系
TEM观察
衬度
electron-beam radiation
organic/inorganic binary system
TEM observation
contrast
