1William Oldfield. Development of Calibration and Verifica-tion Standards in Microstrip to 60 GHz[C]\\ 34th ARFTG Confer-ence Digest-Winter, 1999: 26-32.
5[1]Zhu N H. Phase uncertainty in calibrating microwave test fixtures [J]. IEEE Trans. Microwave Theory Tech. , 1999, 47(10) :1917-1922.
6[2]Zhu N H and Auracher F. Correlation of calibration equations for test fixtures [J]. IEEE Trans. Microwave Theory Tech. ,1999,47 (10) :1949-1953.
7[3]Kimmo J S. Calibration of test fixtures using at least two standards[J]. IEEE Trans. Microwave Theory Tech. ,1991,39 (4):624-630.
8[4]Brubaker D and Eisenberg D. Measure S-parameters with the TSD technique[J]. Microwave &. RF, 1985,11: 97-101,159.
9De-embedding and embedding S-parameter network using a vector network analyzer. USA,136421 . 2001
10Qian H,Nassif S R,Sapatnekar S S.Hierarchical Random-walk Algorithm,ms for Power Grid Analysis. IEEE Transon Computer-Aided Design of Integrated Circuits and Systems . 2005
