摘要
单粒子效应是诱发卫星电子设备在轨发生故障的主要原由之一。文章结合实验室开展的空间电子设备单粒子效应敏感性评估试验,介绍了基于脉冲激光单粒子效应试验系统,开展的空间电子设备单粒子效应敏感性评估试验研究,分析总结了空间电子设备单粒子效应敏感性评估试验和加固措施验证的基本过程和试验结果。依据试验过程和结果分析,提出了空间电子设备系统级单粒子效应加固性能实验验证的基本要求和建议。
The Single Event Effects (SEE)is one of the main factors that inducing the failures in electronic device on satellite. The experimental researches that to identifying the SEE sensitivity of electronic device by using the Pulsed Laser System(PLS) has been introduced,the basis procedures for verifying SEE hardening design based on PLS and some experimental results has been summarized. Based on the analysis of experimental results, the main requirements and suggestions for system-level verifying SEE sensitivity hardening design of electronic device have been proposed.
出处
《空间电子技术》
2015年第3期81-87,共7页
Space Electronic Technology
基金
国家自然科学基金项目:(编号:11375078
编号:11475078)
关键词
单粒子效应
脉冲激光
集成电路
Single event effects
Pulsed laser beam
Integrated circuits