基于FPGA及LVDS的大尺寸测量系统设计

Design of Large Size Measuring System Based on FPGA and LVDS

为克服CCD成像物体尺寸测量系统中存在大物体尺寸测量精度低、抗干扰能力弱、控制复杂且成本高等问题,设计了一种基于FPGA及LVDS的具有抗干扰能力的大物体尺寸测量系统。该系统通过自扫描光电二极管列阵(SSPD)完成数据采集,经过A/D量化后经由LVDS芯片传输,完成信号噪声的滤除,然后由FPGA调用内部IP核对数据进行缓存,最后将数据传送到上位机进行实时显示。实验结果表明,该系统具有较强抗干扰能力、高速处理能力,操作简单、成本低,同时实现了对大物体尺寸测量且具有较高精度。

Recently, tile large object size measurement system based on CCD has the problem of low measuring precision in large size, bad anti-jamming capability, complex control and high cost. Therefore, a large size object measurement system is designed in this paper. A strong anti-interference ability is integrated in the system based on FPGA and LVDS. This system has fbur steps. First of all, tire self-scanned photodiode array （SSPD） is used to complete tire data collection. Secondly, quantify data with A/D chip. Thirdly, transmit quantified data with LVDS chip to fiher noise signal. Fourthly, cache data through IP core in FPGA. Fi- nally, transfer datum to PC in real time display. Experimental results show that the syslem has strong anti-interferen（＇e ability, high processing capacity, simple operation, low cost and high precision in large size object measurement.