7Girard P, Guiller L, Landrauh C, et al. A Test Vector Ordering Technique for Switching Activity Reduction during Test Operation[C]//Proceedings of Ninth Great Lakes Symposium, March 1999:24-27.
8Puterman M L. Markov decision proceses[M]. Hoboken:Wiley, 2005 : 83-91.
9Chandra A, Chakrabarty K. System-on-a chip test data compression and decompression architectures based on Golomb codes [J]. IEEE Transactions on CAD of Integrated Circuits and System, 2001, 20(3): 355～368
10Chandra A, Chakrabarty K. Frequency-directed run length(FDR) codes with application to system-on-a-chip test data compression [A]. In: Proceedings of VLSI Test Symposium,Marina Del Rey, California, 2001. 42～47
