电路软差错率评估综述

Survey on Circuit Soft Error Rate Evaluation

综述了近10年来软差错影响下的电路可靠性分析方法,主要从系统结构级、寄存器传输级、门级、电路级4个抽象层次进行了分析,在每个抽象层次上再依据方法属性进行了分类比较.结果表明,多数情况下,基于的抽象层次越高,时间开销越小而准确度越低;不同属性的方法中模型解析法更简易可行,而故障模拟方法更贴合实际.

A survey of reliability analysis methods on soft error of recent ten years is conducted, which is expected to be helpful to future research. During the comprehensive methods introduction, they are categorized into architecture -level, register-transfer-level （ RTL ）, gate -level and circuit-level, and are compared according to method property in each level. In conclusion, it is found that in most cases, the higher the base abstract level is, the less the time overhead is and the lower accuracy is, and among methods with different property, the analytical method is maneuverable, while the fault simulation method is closer to actual issue.