摘要
用热氧化法在空气中加热铜片制备了CuO纳米线(CuO NWs),通过FESEM对纳米线表面进行了观察,并用液体转移法组装成功了一种简单的阻变存储器件。通过I-V测试系统观察到了Cu/CuO NWs/Cu器件表现出了明显的双极型和单极型。最后通过对比高阻态(HRS)和低阻态(LRS)的表面形貌,解释了Cu/CuO NWs/Cu器件的阻变机制。
The CuO nanowires were prepared by a thermal oxidation method of heating the copper plate in air.The nanowires surface was observed with field emission scanning electron microscope(FESEM),and a simple RRAM was assembled by liquid transferring method.Obvious bipolar and unipolar properties of the Cu/CuO NWs/Cu device were observed by I-Vtest.Finally by comparing the surface morphology of high resistance state(HRS)and low resistance state(LRS),the resistance mechanisms of the Cu/CuO NWs/Cu device was explained.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2015年第2期120-123,共4页
Research & Progress of SSE
基金
国家自然科学基金资助项目(11204105)
关键词
氧化铜
阻变存储器
CuO
resistive random access memory(RRAM)