盖板结构对外壳密封可靠性影响的有限元分析

Finite Element Analysis of Effects of Cover Plate Structure on Sealing Reliability of Package

针对器件在密封可靠性检测过程中的结构易失效现象,利用ABAQUS有限元数值方法对器件外壳在密封检验过程中的结构可靠性进行仿真分析,计算和分析了不同盖板结构设计对外壳受力分布和受力形式的影响,预测外壳潜在的结构失效薄弱区,定量评估盖板结构对外壳结构可靠性的影响规律。结果表明外壳应力大小与盖板结构密切相关,不同结构的应力最大值相差15.7倍,通过盖板结构的优化,可有效避免外壳结构薄弱区,并从理论上阐述了盖板结构对应力影响的机制。

For structural failure of devices in reliability test process,a 3Dcalculating model of structural reliability of devices in sealing test process was established by using ABAQUS finite element simulation software in this paper,in order to study the effect of structural design of cover plate on the distribution and magnitude of residual stress systematically.Potential structural weakness part of package was predicted,and quantitative evaluation was performed for effects of cover plate structure on package reliability.The results of simulation showed that stress of package was closely related to cover plate structure,and there was 15.7times difference of the tensile stress of the package with five cover plates.The weakness part could be avoided through structural optimization of cover plate,and influence mechanism of cover plate structure on stress was described systematically in theory.