CCD系统增益标定及不确定度评定

System Gain Calibration of CCD and Evaluation of Uncertainty

系统增益是电荷耦合器件（CCD）的重要技术参数之一，它是测定量子效率、读出噪声、满阱容量等性能参数的基础。随着成像技术的发展，精确标定CCD的系统增益变得越来越重要。介绍了光子转移曲线（PTC）方法标定系统增益的原理，提出利用改变光源强度的方式来获取光子转移曲线，并搭建了相关测试系统，实现了CCD系统增益的精确标定，得出被测器件的系统增益值为1．6229e／ADU。同时还和改变曝光时间的测量方式进行了对比，两种方法的标定结果基本一致，验证了本方案的准确性。最后，对标定结果进行了不确定度评定。

System gain is one of the important parameters of charge coupled device （CCD）, from which many of the other performance parameters such as quantum efficiency, readout noise, full well CCD and so on are determined. With the development of imaging technology, accurate calibration for the system gain of CCD become more and more important. The theory of measuring system gain based on photon transfer curve technique is introduced. A method to acquire photon transfer curve by changing light intensity is proposed. At the same time, an experimental setup is constructed to calibrate system gain of CCD precisely. It is shown that the result of calibration is 1. 6229e-/ADU which has a good consistency with the method to obtain photon transfer curve by changing exposure time. At last, the uncertainty of this calibration is evaluated.