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Limits on rough-particle sizing with low-defocus interferometric imaging 被引量：2

Limits on rough-particle sizing with low-defocus interferometric imaging
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摘要 We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these patterns are no longer representative of particle size but of the aperture itself and the defocus parameter. We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these patterns are no longer representative of particle size but of the aperture itself and the defocus parameter.
作者 M.Brunel L.Ouldarbi H.Shen G.Grehan S.Cetmellec
机构地区 Dpartement Optique et Lasers
出处 《Particuology》 SCIE EI CAS CSCD 2015年第5期52-58,共7页 颗粒学报（英文版）
关键词 lnterferometric out-of-focus imaging Irregular rough particles Generalized Huygens-Fresnel integrals lnterferometric out-of-focus imaging Irregular rough particles Generalized Huygens-Fresnel integrals
分类号 O436 [机械工程—光学工程]
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Particuology
2015年 第5期

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