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Ageing mechanisms and reliability of graphene-based electrodes 被引量:1

Ageing mechanisms and reliability of graphene-based electrodes
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摘要 The development of flexible transparent electrodes for next generation devices has been appointed as the major topic in carbon electronics research for the next five years. Among all candidate materials tested to date, graphene and graphene based nanocomposites have shown the highest performance. Although some incipient anti-oxidation tests have been reported, in-deep ageing studies to assess the reliability of carbon-based electrodes have never been performed before. In this work, we present a disruptive methodology to assess the ageing mechanisms of graphene electrodes, which is also extensible to other carbon- based and two-dimensional materials. After performing accelerated oxidative tests, we exhaustively analyze the yield of the electrodes combining nanoscale and device level experiments with Weibull probabilistic analyses and tunneling current simulation, based on the Fowler-Nordheim/Direct-Tunneling models. Our experiments and calculations reveal that an ultra-thin oxide layer can be formed on the pristine surface of graphene. We quantitatively analyze the consequences of this layer on the properties of the electrodes, and observed a change in the conduction mode at the interface (from Ohmic to Schottky), an effect that should be considered in the design of future graphene-based devices. Future mass production of carbon-based devices should include similar reliability studies, and the methodologies presented here (including the accelerated tests, characterization and modeling) may help other scientists to move from lab prototypes towards industrial device production. 为下一代设备的灵活透明电极的发展在碳电子学研究作为主要话题被指定下一五年了。在迄今为止测试的材料, graphene 和 graphene 基于的所有候选人之中, nanocomposites 显示出高效。尽管一些早期的反氧化测试被报导了,估计基于碳的电极的可靠性的在里面深的变老研究以前从来没被执行过。在这个工作,我们在场估计 graphene 电极的变老的机制的造成分裂的方法论,它对另外的 carbonbased 和二维的材料也可扩展。在执行加速的氧化测试以后,我们用尽一切地分析把 nanoscale 和设备水平实验与 Weibull 概率的分析和通道水流模拟相结合的电极的收益,基于 Fowler-Nordheim/Direct-Tunneling 模型。我们的实验和计算表明极端薄的氧化物层能在 graphene 的太古的表面上被形成。我们份量上分析电极的性质上的这层的后果,并且在接口在传导模式观察了一个变化(从对 Schottky 欧姆) ,应该在未来的设计被考虑的效果基于 graphene 的设备。基于碳的设备的未来大量生产应该包括这里介绍的类似的可靠性研究,和方法论(包括加速的测试,描述并且建模) 可以帮助另外的科学家向工业设备生产从实验室原型移动。
出处 《Nano Research》 SCIE EI CAS CSCD 2014年第12期1820-1831,共12页 纳米研究(英文版)
关键词 ELECTRODE local oxidation conductive atomic force microscopy (CAFM) TUNNELING 透明电极 老化机理 可靠性 石墨 设备生产 抗氧化试验 烯基 直接隧穿
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