摘要
为了满足单个纳米结构的操纵和物理测量需求,设计制作了透射电子显微镜内置扫描探针装置,实现了纳米操纵、物性测量和原位结构表征的功能,从而建立起低维材料独特性质与其本征结构的一一对应关系.
In order to meet the demand of manipulation and physical measurement of an individual nanostructure, a scanning probe microscope had been built inside a transmission electron microscope, by which nanomanipulation, physical measurement and in-situ structural characterization could be re- alized. This instrument was powerful in a way that it could directly correlate the atomic-scale struc- ture with the unique properties of low-dimensional materials.
出处
《物理实验》
2015年第9期12-15,共4页
Physics Experimentation
基金
国家自然科学基金科学仪器基础研究专款项目(No.11027402)
关键词
透射电子显微镜
扫描探针技术
纳米操纵
纳米测量
transmission electron microscope
scanning probe technique
nanomanipulation
measurement
