YSZ/YSZ-NiO电解质薄膜在低温条件下的电学特性研究

Electrical characterization of YSZ/YSZ-NiO grown by pulsed laser deposition for low temperature solid oxide fuel cells

采用脉冲激光沉积(PLD)法,在多孔支撑的NiO-YSZ阳极基底上制备YSZ电解质薄膜。利用XRD、SEM和射频阻抗/材料分析仪对多层膜的物相结构、表面形貌以及电学特性等进行表征。实验结果发现,YSZ电解质薄膜在300-500℃之间,其电导活化能最小值为0.86e V,电导率可达到7.96×10-5s/cm。

This study is focused on the yttria stabilized zirconia （YSZ）thin films onto porous supporting NiO-YSZ anode substrates using pulsed laser deposition （PLD）. The phase, structure, surface morphology and electrical properties of oxygen ion conductor electrolyte of YSZ thin films were characterized by X-ray diffraction （XRD）, scanning electron microscope （SEM）and electrochemical impedance spectroscopy, respectively. Minimum conductivity activation energy of YSZ thin films is 0.86eV at 300- 500%, and the conductivity can achieve 7.96×10^-5s/cm.