摘要
作为目前全球最受瞩目的新一代光源,LED因其高亮度、低热量、长寿命、无毒、可回收再利用等优点,被称为21世纪最有发展前景的绿色照明光源。随着LED的广泛应用,市场上对于LED驱动IC的需求也越来越大。所以,对LED驱动类IC测试环节的周期和准确度要求越来越高。为了提高测试效率,多SITE高效率的IC测试越来越受芯片厂商的青睐。对于LED驱动芯片的多管芯并行测试进行了详细的介绍,并对8工位并行测试的硬件设计和软件编程做了进一步的研究。
As one of the world＇s most popular new generation of light source, LED has the advantages of high brightness, low heat, long life, non-toxic, recyclable, and so on, it is known as the most promising green lighting source in twenty-first Century. With the wide application of LED, the market demand for LED driver IC is also growing. Therefore, the cycle and accuracy requirements of the IC test link are increasingly high. In order to improve the efficiency of the testing, the IC testing of multi SITE is becoming more and more popular. In the paper, a detailed introduction is made on the parallel test of LED driver chip, and the hardware design and software programming of the 8 positions driver chip are further studied.
出处
《电子与封装》
2015年第9期17-20,共4页
Electronics & Packaging
