摘要
RFID标签天线方向图是RFID标签的一项重要性能指标。由于标签没有标准的接口进行馈电,很难采用传统的天线测量方法测量标签天线方向图。基于RFID标签的双站散射原理和雷达截面差值(ΔRCS)概念,提出了一种新的测试方法,可以对封装好的商业标签进行天线方向图测量。通过对一种商用超高频标签进行实测与仿真,证明两者的结果具有很好的一致性。
Radiation pattern of RFID tag antenna is one of the most important performance indexes of RFID tag. However, it is difficult to measure the radiation pattern of RFID tag antenna by the traditional antenna measurement methods because of there being no standard feeding point on RFID tags. A new method based on bistatic scattering principle and the concept of Delta radar cross section （ARCS） was presented, which could measure the radiation pattern of commercial RFID tag with package. Measurements and simulations were performed using a commercial UHF RFID tag, and the two results were proved to be in good accordance with each other.
出处
《微电子学》
CAS
CSCD
北大核心
2015年第5期689-692,共4页
Microelectronics
基金
质检公益性行业科研专项资助项目(201110005)
关键词
RFID
方向图
标签
双站散射
雷达截面差值
RFID
Radiation pattern
Tag
Bistatic scattering
Delta radar cross section （ARCS）
