基于DII的窄间隙焊接技术专利情报分析

Patent Information Analysis of Narrow Gap Welding Technology Based on DII

基于德温特专利数据库(DII),对全球窄间隙焊接技术专利申请的年度变化、地域分布、主要专利权人,核心专利等方面进行了技术分析,并运用VOSviewer绘制了窄间隙焊接技术专利手工代码的聚类标签地图和密度地图,揭示了全球窄间隙焊接技术的发展现状,为我国的窄间隙焊接发展趋势提供有价值的专利情报。

Based on Derwent Innovation Index （DⅡ）, the Patent Information Analysis of Narrow Gap Welding Technology was conducted which concludes annual changes of patent applications, the geographical distribution, the major patent holders and the core patents. The paper gave out the clustering label map and density map of manual codes of DⅡ by VOSviewer which re- vealed the development of domestic and foreign technology of narrow gap welding and provides valuable Patent Information.