离线式电离辐照面阵CCD测试系统

An Off-line Array CCD Test System for Ionizing Radiation Experiment

研究CCD受到射线辐照后的电离辐照效应或者损伤机制,对于在辐射场环境下如何正确应用CCD开展科学研究具有重要的意义。针对面阵CCD的辐照损伤效应的测试方法的要求,选用ICX285面阵CCD作为实验样品,结合辐照板离线和参数测试装置研制了离线式的测试系统,并且针对辐照实验的测试要求,设计了积分时间可调和过扫描设计两种功能,以获取CCD的暗信号和转移效率的变化。在60Co-γ射线源上,运用该系统开展了电离辐照效应实验,获得了受到射线辐照后面阵CCD暗信号的变化规律。

It is significant to study the effect of irradiation on the Charge Coupled Device（CCD） in order to correctly use it in irradiation environment. In this paper, we choose the ICX285 array CCD as the experimental sample. To satisfy the ionizing radiation effects experiments specifications, an off-line array CCD test system is presented to meet the demand of ionizing irradiation measurement, which contains a radiation circuit card and a test device for this array CCD. The system has two special functions： programmable integral time and overscanning dummy pixels controlling. It has been applied for the experiments of ionizing radiation effects on array CCDs with an 60Co-γ ray source, and has played an important role in understanding of the dark signal changes of array CCD after ionizing radiation damage.