基于Sigma-Delta调制技术的片内正弦激励生成方法

Research of On-Chip Sine Stimulus Based on Sigma-Delta Modulation Techniques

针对模拟混合信号ADC的内建自测试,研究了基于Sigma-Delta调制技术的片内正弦激励生成方法,着重对该方法软件部分的实现进行了阐述.通过设计Sigma-Delta调制器,并对输出的比特流特性进行分析,提出了满足信噪比要求的最短比特流长度选择方法,以及在该长度下的比特流序列优化方法.以12位待测ADC为例,采用该方法生成了最优比特流序列,满足了信噪比的设计要求,验证了方法的可行性.

With reference to the built-in-self-test（BIST）of analog-mixed signal AD converters,on-chip sine stimulus based on sigma-delta modulated techniques was studied.The research was mainly focused on the software implementation.By designing Sigma-Delta modulator,and analyzing the attributes of output bitstreams,we provided a scheme for shortest bitstreams selection and their optimization.In this paper,a 12-bit ADC was chosen to be tested.The output bitstreams with the required signal-to-noise ratio（SNR）were generated,which verifies the feasibility of the method.