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光伏组件隐裂特性的研究进展(上) 被引量:4

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摘要 总结晶体硅电池隐裂的研究进展,给出相关测试标准,探讨隐裂探测方法和相关标准中的载荷测试,研究分析在电池生产和电站运行过程中可能造成隐裂和隐裂扩展的原因,并给出隐裂解决方案。通过研究隐裂的特性和测试方法,来降低组件发生隐裂的概率,从而保证组件的可靠性和使用寿命。
出处 《太阳能》 2015年第10期47-51,共5页 Solar Energy
基金 教育部博士点基金(20130009130001) 教育部博士点基金(20120009130005) 国家自然科学基金(51272022) 中央高校基本科研业务费专项资金(2012JBZ001)
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  • 1Buehler M J, van Duin A C, Goddard Ⅲ W A. Multiparadigm modeling of dynamical crack propagation in silicon using a reactive force field[J]. Physical review letters, 2006, 96(9): 095505.
  • 2Wohlgemuth J H, Cunningham D W, Placer N V, et al. The effect of cell thickness on module reliability[A]. 33rd IEEE Photovoltaic Specialists Conference(PVSC'08)[C], San Diego, CA, USA, 2008.
  • 3Paggi M, Corrado M, Rodriguez M A. A multi-physics and multi-scale numerical approach to microcracking and power- loss in photovoltaic modules[J]. Composite Structures, 2013, 95:630 638.
  • 4Kontges M, Kunze I, Kajari-Schr6der S, et al. The risk of power loss in crystalline silicon based photovoltaic modules due to micro-cracks[J]. Solar Energy Materials and Solar Cells, 2011, 95(4): 1131 - 1137.
  • 5Kajari-Schrader S, Kunze I, Either U, et al. Spatial and orientational distribution of cracks in cryslalline photovoltaic modules generated by mechanical load tests[J]. Solar Energy Materials and Solar Cells, 2011, 95(11): 3054 - 3059.
  • 6Standard I. 61215. Crystalline silicon terrestrial photovoltaic (PV) modules-Design qualification and type approval[S]. 1995.
  • 7Wohlgemuth J H, Cunningham D W, Monus P, et al. Long term reliability of photovoltaic modules[A]. Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion [C], Waikoloa, HI, 2006.
  • 8Fuyuki T, Kitiyanan A. Photographic diagnosis of crystalline silicon solar cells utilizing eleetrolumineseence[J]. Applied Physics A, 2009, 96(1): 189 - 196.
  • 9Wen T K, Yin C C. Crack detection in photovoltaic cells by interferometric analysis of electronic speckle patterns[J]. Solar Energy Materials and Solar Cells, 2012, 98:216 - 223.
  • 10Trupke T, Bardos R, Abbott M, et al. Fast photoluminescence imaging of silicon wafers[A]. Conference Record of the 2006 I EEE 4th World Conference on Photovoltaic Energy Conversion[C], Waikoloa, HI, 2006.

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