摘要
采用X射线荧光光谱法快速无损扫描测定电子电气产品中19种元素,考察了特征X射线以及计数时间的选择,并通过自制标准块绘制标准曲线。同时利用MAPPING功能进行微区原位扫描,掌握19种元素的分布情况及分布特征。并利用换算因子计算REACH高关注物质的含量,对19种元素进行风险性评价。
X ray fluorescence spectrometry was used to determine 19 kinds of elements in electronic and electrical products. The selection of characteristic X ray and counting time were discussed,and the standard curve was drawn by self-made standard block. The method had good accuracy and precision. At the same time,using the MAPPING function to carry out the situ scanning on micro area,the distribution of 19 kinds of elements could be grasped quickly. Finally,conversion factor could be used to calculate the content of REACH SVHC.The possibility of the existence of 19 kinds of elements in the product material was also discussed. Risk assessment of 19 kinds of elements in the electronic and electrical products was realized.
出处
《分析试验室》
CAS
CSCD
北大核心
2015年第11期1295-1299,共5页
Chinese Journal of Analysis Laboratory
基金
上海出入境检验检疫局项目(HK023-2015)资助
关键词
XRF
电子电气产品
快速无损
分布研究
风险评估
XRF
Electronic and electrical products
Rapid-nondestructive technique
Distribution research
Risk assessment