期刊文献+

添加剂对微盲孔铜沉积的影响研究 被引量:2

Effect of additives on copper electrodeposition for microvia filling
下载PDF
导出
摘要 采用恒电流(GM)电化学方法研究了电镀添加剂(3-巯基-1-丙烷磺酸钠(SPS)、环氧乙烷/环氧丙烷嵌段聚合物(EO/P05800)、3-羧基-1-(苯基甲基)吡啶翁氯化钠(BN—Betaifie))相互作用及其对铜沉积电位的影响,运用循环伏安(cV)技术分析了添加剂在电极表面的吸附以及旋转圆盘电极(RDE)转速、添加剂浓度对覆盖率的影响。包含0.0001%SPS、O.02%~O/PO、O.001%BN—Betaine的酸性镀铜液用于盲孔铜沉积测试,分析了电镀填孔在不同时期(初始期、爆发期、末期)盲孔填充性能变化规律。借助多物理场耦合平台,建立微盲孔铜沉积模型,用有限元方法讨论了电镀铜过程,获得铜沉积速率变化规律,结论与实验结果一致。 The interactions among additives employed in acidic copper plating solution for microvia filling and effect on the copper deposition potential was characterized by galvanostatic measurement (GM). The adsorption behavior and surface coverage of additives with various concentrations under different rotation speeds of working electrode were investigated by cyclic voltammetry (CV) measurement. Microvia filling by copper electrodeposition was carried out using acid plating bath containing lppmSPS, 200ppm and 10ppmBN-Betaine. According to SEM images of microvia at the different times, evolution of the shape of microvia and variation of the electrodeposition rate at the bottom of microvia and surface were analyzed. Further, a microvia filling model was constructed using a multi-physics coupling technology based on the finite element method. Modeling result was presented and compared with the measured data, which was in good agreement with the experiments.
出处 《印制电路信息》 2015年第A01期123-131,共9页 Printed Circuit Information
基金 文章得到广东省引进创新科研团队计划的资助,国家自然科学基金
关键词 印制电路板 电镀铜 多场耦合 Printed Circuit Board (PCB) Copper Electrodeposition Multi-Physics Coupling
  • 相关文献

参考文献13

  • 1Pohjoranta A, Tenno R. Microvia fill process model and control[J]. Journal of Mathematical Chemistry,2014,52(5): 1414-1440.
  • 2Garich H, Gebhart L, Taylor E J, et al. Development and Characterization of Plating Cell Geometry for PCB and Packaging Applications[J]. ECS Transactions,2007,3 (16): 1-10.
  • 3Broekmann P, Fluegel A, Emnet C, et al. Cl-assification of suppressor additives based on synergistic and antagonistic ensemble effects[J]. Electrochimica Acta,2011,56(13):4724-4734.
  • 4Willey M J, West A C. SPS adsorption and desorption during copper electrodeposition and its impact on PEG adsorption[J]. Journal of The Electrochemical Society,2007,154(3):D156-D162.
  • 5Choe S, Kim M J, Kim H C, et al. Degradation of Bis (3-sulfopropyl) Disulfide and Its Influence on Copper Electrodeposition for Feature Filling[J]. Journal of The Electrochemical Society,2013,160(12) :D3179-D3185.
  • 6Yang L, Radisic A, Deconinck J, et al. Stochastic Modeling of Polyethylene Glycol as a Suppressor in Copper Electroplating[J]. Journal of The Electrochemical Society,2014,161(5):D269-D276.
  • 7Ryan K, Dunn K, van Eisden J, et al. Properties of PEG, PPG and Their Copolymers: Influence on Copper Filling of Damascene Interconnects [J]. Journal of The Electrochemical Society,2013,160(12):D3186-D3196.
  • 8Xiao N, Li D, Cui G, et al. Adsorption behavior of triblock copolymer suppressors during the copper electrodeposition[J]. Electrochimica Acta,2014,116:284-291.
  • 9Tsai H C, Chang Y C, Wu P W. Rapid galvanostatic determination on levelers for superfilling in Cu electroplating[J]. Electrochemical and Solid-State Letters,2010,13 (2):D7-D 10.
  • 10Huang Q, Baker-O' Neal B C, Parks C, et al. Leveler effect and oscillatory behavior during copper electroplating[J]. Journal of The Electrochemical Society,2012,159(9):D526-D53 t.

同被引文献19

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部