期刊文献+

沉金IMC生长机理及其针状IMC导致焊点失效的原因分析

The growth mechanism of ENIG's IMC and the reason analysis of solder joint failure caused by needle IMC
下载PDF
导出
摘要 在印制电路板的贴装过程中,焊点强度以及后期使用的可靠性越来越受到重视,本文探究了沉金板焊接过程中IMC生长机理以及针状IMC导致焊点强度不足,导致早期失效的原因,通过设计不同的热处理条件以及焊料制备样品,通过推拉力手段测试焊点强度,辅以SEM电镜观察焊点断裂面,确认断裂面形貌以及元素组成,进而分析出IMC生长与温度的关系,发现针状IMC产生与Ag元素有关,而且焊点断裂的本质原因是富磷层厚度。通过本文的研究,可以为沉金板焊接参数优化,防止焊点旱期失效,为提高焊点可靠性提供依据。 In the process of PCB SMT, the solder joint strength and reliability get more and more attentions. The article,explored the IMC growth mechanism of ENIG and the reason analysis of needle IMC in the SMT process, which was result in insufficient of the early solder joint strength. We designed for the examples, using the different heat treatment conditions and welding flux. We tested the strength of the solder joint by the push pull shear apparatus, and then observed the fracture in order to know the fracture morphology and the composition of elements, then we can know the relationship between IMC growth and the temperature, and we fred the relationship between the needle IMC and Ag. Besides the essence reason of the solder joint fracture is the thickness of the rich phosphor layer. Through this study, optimize the welding process parameters of ENIG, prevent premature failure of the solder joints and provide evidences to enhance the solder joint reliability.
出处 《印制电路信息》 2015年第A01期165-172,共8页 Printed Circuit Information
关键词 焊点可靠性 推拉力测试 形貌 焊点失效 沉金 Reliability of Solder Joints Push Pull Shear Test Fracture Morphology Failure of Solder Points ENIG
  • 相关文献

参考文献10

  • 1蔡积庆.印制电路信息[J].2005,3:59.
  • 2许天旱,金志浩,王党会.SnAgCu系无铅钎料合金力学性能及钎焊性能研究[J].稀有金属材料与工程,2009,38(8):1462-1466. 被引量:3
  • 3栗慧,卢斌,王娟辉.微量Ce对SnAgCu焊料与铜基界面IMC的影响[J].电子元件与材料,2009,28(4):40-42. 被引量:9
  • 4SUN P, ANDERSSON C,WEI X C,High temperature aging study of intermetallic compound formation of Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on electroless Ni(P) metallization[J]. Journal of Alloys and Coupounds,2006,425:191-199.
  • 5PENG W Q,MONLEVADE E.Effect of thermal aging on the interracial structure of SnAgCu solder joints on Cu[J]. Microelectronics Reliability,007,47:2161-2168.
  • 6LIN P, YAO P.Effects of multiple reflows on interracial reaction and shear strength of SnAgCu and Sn Pb solder joints with different PCB surface finishes[J]. Journal of Alloys and Compounds,2009:188-194.
  • 7C.E.Ho,Y.L.Lin,C.R.Kao.Strong Effect of Cu concentration on the Reaction between Lead-Free Microelectronic Solders and Ni[J]. Chemistry of Materials,2002,14(3):949-951.
  • 8C.E.Ho,R.Y.Tsai,Y.L.Lin,C.R.Kao.Effect of Cu Concentration on the Reactions between Sn-Ag-Cu Solders and Ni[J]. Journal of Electronic Materials,2002,31(6):584-590.
  • 9唐兴勇,王珺,谷博,俞宏坤,肖斐.老化对sn-Ag-Cu焊料/Ni-P镀层界面结构和剪切强度的影响[J].金属学报,2006,42(2):205-210. 被引量:3
  • 10陈信文,林士刚,黄育智等.无铅焊料相关多元材料系统(Sn-Ag—Cu—Ni、Sn.In—Cu.Ni及sn—In.Ag—Ni)之润湿性、界面反应、相平衡与固化特性讨论.行政院国家科学专题研究计量期中进度报告,1995.

二级参考文献50

共引文献11

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部