期刊文献+

光纤通信传输典型设备可靠性模型研究 被引量:12

Research on Reliability Models of Typical Transmission Equipment in Optical Fiber Communication
下载PDF
导出
摘要 对设备的可靠性研究是实现设备持续保障的条件。首先分析了光纤通信传输系统中波分复用设备的功能及配置,建立了波分复用设备的可靠性框图模型。然后根据建立的可靠性框图模型及相关数学模型,计算分析得出波分复用设备可靠性指标的预测值。最后将预测值与实际值进行了比较,结果表明,预测值非常接近实际值,从而验证了所建立的可靠性模型用于设备可靠性指标的预测是可行的。 The function and configuration of the Wavelength Division Multiplexing equipment in the optical fiber communication transmission system was analyzed,and the reliability diagram model of the Wavelength Division Multiplexing equipment was established.Then the predictive value of the equipment reliability index was calculated based on the reliability diagram model and the related mathematical model.By comparing the predictive value and the actual values,it shows that the predicted values is very close to the actual value,so the feasibility of the reliability model used to forecast the reliability index of the equipments is verified.
出处 《半导体光电》 CAS 北大核心 2015年第5期796-799,共4页 Semiconductor Optoelectronics
关键词 波分复用 可靠性框图模型 故障率 平均故障间隔时间 WDM division multiplexing reliability diagram model failure rate MTBF
  • 相关文献

参考文献5

二级参考文献22

  • 1张涛,郭波,谭跃进,刘芳.一种基于BDD的多阶段任务系统可靠度新算法[J].系统工程与电子技术,2005,27(3):446-448. 被引量:9
  • 2史宪铭,郭波,武小悦,梁亮.快速研制系统可靠性指标体系研究[J].机械与电子,2005,23(4):67-69. 被引量:1
  • 3周源泉,刘振德,陈宝延,马同玲.指数分布阶段可靠性增长模型的Bayes融合[J].质量与可靠性,2006(2):14-18. 被引量:12
  • 4Andrew K, Armen Z. Reliability evaluation of process models [ J ]. IEEE Trans. on Components Packaging and Manufacturing Technology, part A, 1996, 19(2) : 268--275.
  • 5Akers S B. Binary decision diagram[J]. IEEE Trans. on Computers, 1978, 27(6) : 509--516.
  • 6Bryant R E. Graph-based algorithm for Boolean function manipulation [ J ]. IEEE Trans. on Computers, 1986, 35 ( 8 ) : 677--691.
  • 7Singh H, Vaithilingam S, Anne R K, et al. Terminal reliability using binary decision diagrams [ J ]. Microelectron. Reliab. 1996, 36(3): 663--365.
  • 8Alferness Rod C, Bonenfant Paul A, Newton Curtis J, et al. A practical vision for optical transport networking [J]. Bell Labs Technical Journal, 1999,4(1) :3-6.
  • 9YANG G. Life cycle reliability engineering [M] . New York: John Wiley & Sons, Inc., 2007.
  • 10KRASICH M. Reliability growth test design-connecting math to physics [C] //Annual Proceedings of Reliability and Maintainability Symposium (RAMS) . 2011 : 1-7.

共引文献9

同被引文献142

引证文献12

二级引证文献50

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部