期刊文献+

行星式双面研磨轨迹均匀性研究 被引量:5

Research on Uniformity of Trajectory in Planetary Double-Side Lapping Process
下载PDF
导出
摘要 蓝宝石(α-Al_2O_3)是一种机光电性能优良的功能晶体材料,在半导体和光电子等行业得到了广泛的应用。行星式双面研磨是蓝宝石基片平面加工的重要手段,加工过程中磨粒轨迹的均匀性对工件的加工精度和表面质量有着重要的影响。通过运动学分析建立了双面研磨磨粒轨迹方程和速度方程,提出一种基于Matlab离散统计的磨粒轨迹均匀性定量评价方法,并求取设定参数下双面研磨轨迹分布均匀性的方差值。 Sapphire is a kind of functional crystal material with excellent properties and widely used in the semiconductor and optoelectronic industry. Planetary double-side lapping is one of the most important methods in processing sapphire, the machi-ning precision and surface quality of work pieces are affected by the uniformity of abrasive trajectory significantly. In this pa-per, trajectory and velocity equations of abrasive are set up through the kinematical analysis of double-side lapping, and then a quantitative evaluation method of trajectory uniformity based on the Matlab discrete statistics is presented. With this method, variance value of abrasive's trajectory uniformity under given parameters is calculated and offers reference for the optimization of double-side lapping parameters.
出处 《机械研究与应用》 2015年第6期41-43,共3页 Mechanical Research & Application
关键词 蓝宝石 双面研磨 研磨轨迹 轨迹均匀性 统计分析 sapphire double-side lapping trajectory uniformity statistics and analysis
  • 相关文献

参考文献3

  • 1Jinshuang Yang, Xianglong Zhu, Zhigang Dong, et al. Design ofDouble- sided Polishing Machine for Functional Crystal Substrate[J]. Advanced Materials Research,2014(1017):580-585.
  • 2Li Z C, Pei Z J, Funkenbusch P D. Machining processes for sap-phire wafers:a literature review[J]. Proceedings of the Institution ofMechanical Engineers, Part B:Journal of Engineering Manufacture.2011(225):975-989.
  • 3刘建河,杨建东.用图形变换法研究行星机构双面研磨轨迹[J].长春理工大学学报(自然科学版),2002,25(2):40-42. 被引量:8

二级参考文献1

共引文献7

同被引文献40

引证文献5

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部