量子点膜结构及其物理光学特性分析

Quantum Dot Film Structure Analysis and its Physical Optical Properties

采用扫描电镜/能谱仪(SEM/EDS)、傅立叶转换红外光谱仪(FTIR)、热重分析测试仪(TGA)、荧光光谱仪、透光率/雾度仪以及水汽透过率测试仪,对量子点膜(QDEF)进行了宏观/微观形貌和结构、各层主要成分以及物理光学特性分析。结果表明,该量子点薄膜结构为上下两面为阻隔膜,中间层为量子点层(Quantum Dot Layer),各层中主要成分以聚丙烯酸酯和PET为主,TGA显示量子点层含有高含量的耐高温填料,荧光测试显示量子点层含有能够激发绿光和红光的量子点;通过分析判断,该QDEF可替代背光模组中的扩散膜;此外,该量子点膜所用阻隔膜具有10-2-10-3数量级水汽透过率,从而可有效保护量子点层。

Scanning electron microscopy / energy spectrometer （SEM/EDS）, fourier transformation infrared spectroscopy （FTIR）, thermal gravimetric analyzer （TGA）, fluorescence spectrometer, transmittance / haze meter and water vapor penetration tester were used to analyze the macro / micro morphology and structure of quantum dot film （QDEF）, and the main components and physical optical properties of each layer of the film. The results showed that the upper and lower layers of QDEF were barrier films, and the intermediate layer of QDEF was a quantum dot layer,the components of each layer were mainly PET and polyacrylate. The results of TGA showed that the quantum dot layer contained a high content of high temperature resistant filler. The fluorescent test showed that the quantum dot layer contained the quantum dots that could excite the green and red light The structure analysis of QDEF showed that it could be considered as an alternative to the diffusion film in the backlight module. In addition, the barrier film of QDEF had a 10-3 number of water vapor transmission rate, thus effectively protected the quantum dot layer.