一种测量光耦内部结构的方法

A Method of Measuring the Internal Structure of Optocoupler

本文根据光耦的原理,并结合X光下的透视图,理论分析光耦内部电气间隙和爬电距离、绝缘穿透距离的可能存在路径,进而实验中利用3只样品即可快速找到最短路径,此方法可为光耦的产品认证及质量筛选提供了有用的参考。

According to the principle of optocoupler, combined with X-ray perspective, it analyzes theoretically possible path of optoeoupler internal clearance and creepage distance and insulation through distance, and three samples can be quickly found the shortest path in the experiment with this method. This method can provides a useful reference for product certification and quality of the oploconpler screening.