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镧掺杂BiGaO_3多晶薄膜光学性质

The optical properties of La doped BiGaO_3 polycrystalline films
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摘要 采用溶胶-凝胶技术在Pt/Ti/SiO_2/Si衬底上制备了不同镧掺杂浓度BiGaO_3(Lx BGO,0≤x≤0.1)薄膜.X-射线衍射(XRD)表明该属于正交晶系的多晶薄膜,原子力显微镜(AFM)图像显示样品表面具有很好的平整性.采用椭圆偏振技术对其光学性质进行了详细的研究,发现其光学常数符合Adachi色散模型.进一步发现其禁带宽度随着镧掺杂浓度的增加而增加,该规律与理论预言相吻合.有关LxBGO材料的研究为铋基光电器件如紫外探测器的实现提供物理基础支持. La doped BiGaO_3(LxBGO) films were fabricated by the Sol-Gel method on the Pt/Ti/SiO_2/Si substrates. Xray diffraction analysis shows that the films are polycrystalline with an orthorhombic structure. The atomic force microscopy images of the Lx BGO films suggest that the surface morphology is smooth. The optical properties of the samples were investigated by the spectroscopic ellipsometry in detail. The dielectric functions were extracted and in good agreement with the Adachi dispersion function. More one step,the optical band gap tends to increase with increasing La composition,which is consistent with the results of theoretical prediction. These results are helpful for the fabrication of Bibased opto-electrical devices such as ultraviolet detectors.
出处 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2015年第4期447-451,共5页 Journal of Infrared and Millimeter Waves
基金 国家重点基础研究发展规划(2011CB922200 2013CB922300) 国家自然科学基金(11374097 61376129) 上海市科学技术委员会项目(13JC1402100 13JC1404200) 上海高校特聘教授(东方学者)项目~~
关键词 BiGaO3 椭圆偏振光谱 光学性质 光学常数 光学禁带宽度 BiGaO3 spectroscopic ellipsometry optical properties optical constants optical band gap
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参考文献15

  • 1Lee H N, Hesse D, Zakharov N, et al. Ferroeleetrie Bi3.25 Lao.75Ti3012 films of uniform a-axis orientation on silicon substrates [ J ]. Science, 2002, 296 (5575) : 2006-2009.
  • 2Zhang S, Zhang J Z, Han M J, et al. Temperature depend- ent near infrared ultraviolet range dielectric functions of nanocrystalline ( Nao.s Bio.5 ) 1- Cex ( Tio.99 Feo.ol ) 03 films [J]. Applied Physics Letters, 2014, 104(4) : 041106.
  • 3Li C L, Wang B, Wang R, et al. First-principles study of structural, elastic, electronic, and optical properties of or- thorhombic BiGaO3 [ J ]. Computational Materials Science, 2008, 42(4): 614-618.
  • 4Baettig P, Sehelle C F, Lesar R, et al. Theoretical predic- tion of new high-performance lead-free piezoeleetries [ J ]. Chemistry of Materials, 2005, 17(6) : 1376-1380.
  • 5Wang H, Wang B, Li Q, et al. First-principles study of the cubic perovskites BiMO3 ( M = A1, Ga, In, and Se) [ J]. Physical Review B, 2007, 75(24) : 245209.
  • 6Belik A A, Wueruisha T, Kamiyama T, et al. High-pres- sure synthesis, crystal structures, and properties of perovs- kite-like BiA103 and pyroxene-like BiGaO3 [ J] . Chemistry of Materials, 2006, 18( 1 ) : 133-139.
  • 7Yusa H, Belik A A, Takayama-Muromaehi E, et al. High- pressure phase transitions in BiMO3 ( M = A1 , Ga, and In) : in situ X-ray diffraction and Raman scattering experi- ments [J]. Physical Review B, 2009, 811(21) : 214103.
  • 8Yan J, Gomi M, Yokota T, et al. Phase transition and huge ferroeleetric polarization observed in BiFel.GaxO3 thin films [ J ]. Applied Physics Letters, 2013, 102 ( 22 ) : 222906.
  • 9Zhang J Z, Ding H C, Zhu J J, et al. Electronic structure and optical responses of nanocrystalline BiGaO3 films: A combination study of experiment and theory [ J ]. Journal of Applied Physics, 2014, 115(8):083110.
  • 10Azzam R M A, Bashara N M. Ellipsometry and polarized light [M]. Amsterdam: Elsevier, 1977, 181.

二级参考文献26

  • 1Lee Jang - Sik, Kang B S, Jia Q x. Data retention characteristics of Bi3.25 La0.75 Ti3 O12 thin films on conductive Sr- RuO3 electrodes [ J ]. Appl. Phys. Lett., 2007, 91 ( 142901 ) : 1-3.
  • 2Mantese Joseph V, Micheli Adolph L, Catalan Antonio B, et al. Formation of lanthanum strontium cobalt thin films by metalorganic decomposition[J]. Appl. Phys. Lett. ,1994, 64 ( 25 ) : 3509-3511.
  • 3Jain M, Karan N K, Yoon J, et al. High tunability of lead strontium titanate thin films using a conductive LaNiO3 as electrodes[J]. Appl. Phys. Lett. ,2007,91(07):2908-2910.
  • 4Wu W B, Wong K H, Choy C L, et al. Top-interface-controlled fatigue of epitaxial Pb ( Zr0.52 Ti0.48 ) O3 ferroelectric thin films on La0.7Sr0.3MnO3 electrodes[J]. Appl. Phys. Lett. ,2000,77(21 ) :3441-3443.
  • 5Wang G S, Hu Z G, Huang Z M, et al. Infrared optical properties of PbZr0.4 Ti0. 6 O3/La0.5 Sr0. 5 CoO3 heterostructures on platinized silicon substrate[J]. Appl. Phys. A,2004,78 (1) :119-123.
  • 6Chen X, Wu N J, Ritums D L, et al. Pulsed laser deposition of conducting porous La-Sr-Co-O films [ J ]. Thin Solid Films, 1999,342 ( 1-2 ) : 61-66.
  • 7Ramesh R, Gilchrist H, Sands T, et al. Ferroelectric La- Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon via template growth[J]. Appl. Phys. Lett. ,1993,63(26): 3592-3594.
  • 8Cheung Jeffrey T, Morgan Peter E D, Lowndes Douglas H, et al. Structural and electrical properties of La0.5Sr0.5CoO3 epitaxial films [ J ]. Appl. Phys. Lett. , 1993,62 ( 17 ) : 2045 -2047.
  • 9Azzam R M A, Bashara N M. Ellipsometry and Polarized Light[ M ]. Amsterdam : Elsevier, 1977,181.
  • 10Hu Z G, Huang Z M, Wu Y N, et al. Ellipsometric characterization of LaNiO3-x films grown on Si (111 ) substrates : Effects of oxygen partial pressure [ J ]. J. Appl. Phys. ,2004 ,95( 8 ) :4036-4041.

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