期刊文献+

Fabrication of superconducting NbN meander nanowires by nano-imprint lithography 被引量:1

Fabrication of superconducting Nb N meander nanowires by nano-imprint lithography
下载PDF
导出
摘要 Superconducting nanowire single photon detector (SNSPD), as a new type of superconducting single photon detector (SPD), has a broad application prospect in quantum communication and other fields. In order to prepare SNSPD with high performance, it is necessary to fabricate a large area of uniform meander nanowires, which is the core of the SNSPD. In this paper, we demonstrate a process of patterning ultra-thin NbN films into meander-type nanowires by using the nano- imprint technology. In this process, a combination of hot embossing nano-imprint lithography (HE-NIL) and ultraviolet nano-imprint lithography (UV-NIL) is used to transfer the meander nanowire structure from the NIL Si hard mold to the NbN film. We have successfully obtained a NbN nanowire device with uniform line width. The critical temperature (Tc) of the superconducting NbN meander nanowires is about 5 K and the critical current (lc) is about 3.5 μA at 2.5 K. Superconducting nanowire single photon detector (SNSPD), as a new type of superconducting single photon detector (SPD), has a broad application prospect in quantum communication and other fields. In order to prepare SNSPD with high performance, it is necessary to fabricate a large area of uniform meander nanowires, which is the core of the SNSPD. In this paper, we demonstrate a process of patterning ultra-thin NbN films into meander-type nanowires by using the nano- imprint technology. In this process, a combination of hot embossing nano-imprint lithography (HE-NIL) and ultraviolet nano-imprint lithography (UV-NIL) is used to transfer the meander nanowire structure from the NIL Si hard mold to the NbN film. We have successfully obtained a NbN nanowire device with uniform line width. The critical temperature (Tc) of the superconducting NbN meander nanowires is about 5 K and the critical current (lc) is about 3.5 μA at 2.5 K.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第1期384-389,共6页 中国物理B(英文版)
基金 supported by the National Basic Research Program of China(Grant Nos.2011CBA00106 and 2009CB929102) the National Natural Science Foundation of China(Grant Nos.11104333 and 10974243)
关键词 nano-imprint lithography meander nanowires ultra-thin NbN films nano-imprint lithography, meander nanowires, ultra-thin NbN films
  • 相关文献

参考文献19

  • 1Gol'tsman G N, Okunev O, Chulkova G, Lipatov A, Semenov A, Smirnov K, Voronov B, Dzardanov A, Williams C and Sobolewski R 2001 Appl. Phys. Lett. 79 705.
  • 2Gol'tsman G N, Korneev A, Minaeva O, Tarkhov M, Kaurova N, Seleznev V, Voronov B, Okunev O, Antipov A, Smirnov K, Vachtomin Y, Milostnaya I and Chulkova G 2009 Journal of Modern Optics 56 1670.
  • 3Gol'tsman G N, Smirnov K, Kouminov P, Voronov B, Kaurova N, Drakinsky V, Zhang J, Verevkin A and Sobolewski R 2003 IEEE Trans. Appl. Supercond. 13 192.
  • 4Bachar G, Baskin I, Shtempluck O and Buks E 2012 Appl. Phys. Lett. 101 262601.
  • 5Delacour C, Claudon J, Poizat J P, Pannetier B and Bouchiata V 2007 Appl. Phys. Lett. 90 191116.
  • 6Yang X Y, You L X, Wang X, Zhang L B, Kang L and Wu P H 2009 Supercond. Sci. Technol. 22 125027.
  • 7Chou S Y, Krauss P R and Renstrom P J 1996 J. Vac. Sci. Technol. B 14 4129.
  • 8Zhao L, Jin Y R, Li J, Deng H, Li H K, Huang K Q, Cui L M and Zheng D N 2015 Appl. Supercond. 25 220605.
  • 9Zhao L, Jin Y R, Li J, Deng H and Zheng D N 2014 Chin. Phys. B 23 087402.
  • 10Sheng X F, Yang X Y and You L X 2010 Chin. Phys. Lett. 27 087404.

同被引文献12

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部