利用X射线衍射相定量分析水泥的主要成分

The analysis on some main components of cement with X-diffraction method

利用X射线衍射分析法分析水泥的几种主要成分 ,检测石膏和硬石膏含量的精确度可以达到± 0 .1% ,检测半水石膏含量的精确度可达± 0 .2 %。因此有必要研发利用X射线衍射分析法 ,达到检测水泥其它成分的目的。

in this paper X diffraction method is applied to analyze some main components of cement. By this method the accuracy of detecting the content of gypsum and harden gypsum in cement can be up to ±0.1%. And the accuracy of detecting the content of semi hydrated gypsum in cement can also be up to ±0.2%.