摘要
本文介绍了一种测量微通道板电子增益的紫外光电法,给出了实验装置、方法和结果,分析和说明了本方法的优点,指出了利用本法同时实现微通道板综合参数测试和象管模拟的可能性。
An ultraviolet photo-electronic method for the measurment of MCP's electron gain is intrduced in the paper. The experiment set-up procedure and some results are given. The advantages of the method are explaned and described, pointing out the possibility of realizing MCP' scomprehensive param eters test, and the image tube simulation simultaneously by the method proposed.
出处
《兵工学报》
EI
CAS
1987年第2期67-71,共5页
Acta Armamentarii
