摘要
This Letter proposes a brand-new filament diameter measurement method based on what is called ＂dual diffraction,＂ in that a grating is added behind the filament to make full use of its subdivision and amplification characteristics. Higher measurement accuracy is achieved by this method compared with the traditional diffraction method. To verify its accuracy, three standard filaments with nominal values of 100.2, 120.1, and 140.8 μm are measured by the dual diffraction method and traditional diffraction method under the same experimental conditions. The relative measurement errors of the new method are less than 0.75%, and its average relative error is reduced by 56% compared with the traditional diffraction method.
This Letter proposes a brand-new filament diameter measurement method based on what is called ＂dual diffraction,＂ in that a grating is added behind the filament to make full use of its subdivision and amplification characteristics. Higher measurement accuracy is achieved by this method compared with the traditional diffraction method. To verify its accuracy, three standard filaments with nominal values of 100.2, 120.1, and 140.8 μm are measured by the dual diffraction method and traditional diffraction method under the same experimental conditions. The relative measurement errors of the new method are less than 0.75%, and its average relative error is reduced by 56% compared with the traditional diffraction method.
