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超高精度离子束抛光工具设计与性能分析

Design and performance analysis of ultra-precision ion beam polishing tool
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摘要 为了解决高精度光学修形问题,进行离子束抛光工具的设计与性能分析研究。通过开展离子束抛光工具设计方法的研究、聚焦离子光学系统结构设计和离子束流特性的分析,进行计算机仿真研究和中和器一体化设计;研制聚焦离子光学系统和中和器,并采用15mm和10mm的聚焦离子光学系统进行修形加工实验,将口径150mm的熔石英平面镜从初始面形误差RMS15.58nm修正到RMS0.79nm。结果证明了聚焦离子光学系统设计的有效性,一体化离子束抛光工具具有亚纳米精度的修形能力。 In order to solve the problem of ion beam figuring, the design and performance analysis of ultra-precision ion beam polishing tool was studied. The research on ion beam polishing tools design method, the structure design of a 3-grid focused ion optics system and the performance analysis of ion beam was covered. Based on the theoretic calculation and computer simulation, a focused ion optical system was developed. In this ion optical system, an integrated plasma bridge neutralizer was designed to fully neutralize ion beam extracted from ion source. Finally, a 150mm flat optics was figured by two designed focused ion optical systems with 15mm and 10mm output diameter. Figuring result shows that the contour error of this flat is decreased from 15.58nm RMS to 0. 79nm RMS. Result further demonstrates that the designed ion beam polishing tool is very efficient to optical ion beam figuring.
出处 《国防科技大学学报》 EI CAS CSCD 北大核心 2015年第6期17-20,共4页 Journal of National University of Defense Technology
基金 国家自然科学基金资助项目(91323302 61505259)
关键词 离子束修形 聚焦离子光学系统 离子束特性 ion beam figuring focused ion optical system ion beam performance
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参考文献9

  • 1Strahler A H. Vegetation eanopy reflectance modeling-recent developments and remote nsing perstetives [ ] ]. Remote Sensing Reviews, 1997, 15(1):179-194.
  • 2Grattan K T V, Sun T. Fiber optic sensor technology: an overview [ J 1. Sensom and Actuators A, 2000, 82 ( 1 ) : 40 -61.
  • 3Shu X W, Huang D X. Highly sensitive chemical sensor based on the measurement of tile separation of dual resonant peaks in a 100-p.m-perind fiber grating [ J 1. Optics Communications, 1999, 171 ( 171 ) : 65 - 69.
  • 4Haensel T, Seidel P, Nickel A,et al. Deterministic ion beam figuring of surfaee erro in the sub-millimeter spatial wavelength range [ C 1//Pr:eedings of tile 6th International Conference Eurnpean Society [br Precision Engineering and Nanoteehnology, 2006.
  • 5Ghigo M, Cauestruri R, Spiga D, el al. Correetinn of high spatial frequency m'rors on optical surfaces by means of ion beam figuring[ CI// Proceedings of SPIE, Optical Manufacturing and Testing VII, 2007, 6671.
  • 6焦长君,解旭辉,李圣怡,周林.光学镜面离子束加工的材料去除效率[J].光学精密工程,2008,16(8):1343-1348. 被引量:4
  • 7万春候.等离子体离子源物理与技术[M].北京:科学出版社,1976:211—276.
  • 8Alton G D, Hbilheux G. Elementary theory for optimum extraction of space-charge-dominated ion beams from plasma boundaries [ J ]. High Energy Physics & Nuclear Physics, 2007, 31 (7) :201 - 205.
  • 9侯良,解旭辉,周林,丁杰.聚焦离子光学系统设计及性能测试研究[J].航空精密制造技术,2013,49(5):17-20. 被引量:3

二级参考文献15

  • 1牛海燕,张学军.φ124 mm口径碳化硅质非球面镜面数控研抛技术研究[J].光学精密工程,2006,14(4):539-544. 被引量:26
  • 2周林,戴一帆,解旭辉,焦长君,李圣怡.光学镜面离子束加工的可达性[J].光学精密工程,2007,15(2):160-166. 被引量:24
  • 3LYNN N A,ROBERT E K. An ion figuring system for large optic fabrication [J]. SPIE,1989,1168:33-50.
  • 4FLAMM D, SCHINDLER A, BERGER M. Ion beam milling of optically polished CaF2 surfaces [J]. SPIE,2003, 5180:81-88.
  • 5BEHRISCH R. Sputtering by Particle Bombardment I[M]. New York.. Springer-Verlag, 1981.
  • 6MAXIM A M, RODOI.FO C, ALBERT-LASZLO B. Morphology of ion-sputtered surfaces[J]. NIM B ,2002,197: 185-227.
  • 7JIAO CH, XIE X H, LI SH Y, et al.. Design of ion beam figuring machine for optics mirrors [C]. Asia Pacific Precision Engineer for Optics Manufacture 2007, HongKong, Janua,2007 : 13-17.
  • 8焦长君,李圣怡,王登峰,解旭辉,周林.离子束加工光学镜面的材料去除特性[J].光学精密工程,2007,15(10):1520-1526. 被引量:24
  • 9Strahler A H. Vegetation canopy reflectance-recent developments and a remote sensing perspective[J].Remote Sensing Reviews,1997,(02):179-194.
  • 10刘金声.离子束技术及应用嗍[M]北京:国防工业出版社,1995.

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