某LED开关电源的高加速寿命试验研究

Highly accelerated life test research on a LED switching power supply

LED作为新兴固态照明系统,其驱动电源的可靠性也引起了广泛的关注。高加速寿命试验作为可靠性强化试验,可以在较短时间内激发电子系统的故障模式。文中以某LED驱动用开关电源为对象,对其高加速寿命试验进行了研究。首先分析了该电源的基本结构与工作原理,确定其失效判据。设计了随机振动步进应力试验方案,得到该电子系统的可靠性薄弱环节,为其可靠性设计提供依据。

LED is a novel solid state lighting system, the reliability of whose driving power supply has attracted a wide attraction. As the reliability enhancement test, highly accelerated life test can excite the failure modes of the electronic system in a short period. Taking the LED-driven switching power supply for the object, this paper proposed a high accelerated life test. Firstly, it analyzed the basic structure and working principle of the switching power supply to determine the failure criterion. The paper also designed the random vibration step stress test plan and found the weak link reliability of the electronic system, which provided the basis for the reliability design.