基于TDR的特性阻抗测量的数据处理

Data processing of characteristic impedance measurement based on TDR

针对特性阻抗的频域测量难以满足工业生产需求的问题,提出了一种基于TDR的特性阻抗的时域测量方法。文中采用TDR模块Agilent54754A,测量标准件电路板的特性阻抗,并将实验测量的文本数据从示波器导入电脑,作为计算电路板特性阻抗的实测数据。然而时域测量方法得到的实测数据容易受到时基抖动和微波反射等的影响,论文采用PDF反卷积法有效去除了数据中的时基抖动,并根据IPC-TM-650规程选择最佳测量区域,有效地去除了微波反射,而且将两种方法综合应用来处理实验数据。将处理过的电压值变换成阻抗值,结论表明,测量数据处理结果十分接近被测件的标定值。

This paper proposed a time domain measurement method of characteristic impedance based on TDR,because frequency domain measurement of the characteristic impedance is difficult to meet the needs of industrial production.This paper measured characteristic impedance of the standard circuit board using the TDR module Agilent54754 A,and imported the text data of the experimental measurement from the oscilloscope to the computer as the measured data of circuit board characteristic impedance calculation.However,the measured data from the time domain measurement method is susceptible to time base jitter and the microwave reflection,the paper eliminated time-base jitter of data by PDF deconvolution method effectively,and removed the microwave reflection by selecting the best measurement zone in accordance with IPC-TM-650 regulations effectively,and integrated of two methods to process the experiment data.By transforming the voltage value into the impedance value,the results showed that data processing results are very close to the calibrated value of DUT.