摘要
冷屏作为红外探测器的重要部件,其内壁消光质量的优劣,直接关系到探测器背景噪声、动态范围和响应均匀性。针对当前正在应用的几种冷屏黑化工艺,通过制备平面样品,测试其在红外谱段2~14μm的平均BRDF数据,结合分析几种工艺方法的特点及实际应用效果,为后续不同类型、不同谱段红外探测器冷屏内壁设计选用何种黑化工艺提供建设性建议。
Cold shield is an important part of IR detector,and the extinction quality of its inner wall directly affects the background noise,dynamic range and response uniformity of IR detector. Using several blackening processes of cold shield,flat samples were prepared. The average BRDF in 2 ~ 14μm infrared waveband was tested. According to test results,the characteristics of several techniques and practical application effects were analyzed,which provide the constructive suggestions for the design of cold shield inner wall of IR detector in different wavebands.
出处
《激光与红外》
CAS
CSCD
北大核心
2016年第2期196-199,共4页
Laser & Infrared
关键词
冷屏
黑化
平均BRDF
cold shield
blackening process
average-BRDF
