扫频光学相干层析成像系统的波数校正与相位测量研究

Wavenumber calibration and phase measurement in swept source optical coherence tomography

相位敏感光学相干层析成像(OCT)系统可以用于高灵敏度的相位探测,在细胞分析、材料检测等方面具有重要应用,但扫频光源的不稳定性会影响扫频OCT系统的相位测量精度.本文提出了一种基于马赫-曾德尔干涉仪(MZI)时域相位信息的波数校正方法.利用MZI时域包裹相位的互相关运算确定各采集波数序列的相对偏移量,鉴于时域包裹相位的非严格周期特征,可确定偏移量的大小不受限制.依据相对偏移量对各序列信号进行时域同步,并基于同步后的MZI时域解包裹相位实施待测干涉信号在位相域的等间隔重采样.基于所提出的波数校正方法,实施了各扫频序列波数偏移量的校正,开展了基于位相信息的光程重复性测量实验.结果表明,即使在不稳定扫频光源的前提下,也能获得高精度的相位测量结果.

Based on the phase information in time domain of a Mach-Zehnder interferometer（MZI）, a method of calibrating the wavenumber of the source is proposed. Cross-correlation of wrapped phase in time-domain of the MZI is adopted to determine drifts among axial-lines. Owing to non-strictly periodic characteristics of wrapped phase in time-domain of the MZI, the determinable range of shift is unlimited. Synchronization of signals in time domain is then performed to correct their corresponding shifts. The obtained results demonstrate that it is feasible to realize phase measurement with high precision even under unstable swept source for the optical coherence tomography system.