摘要
对比了几种不同类型的过电压因子下绝缘堆闪络概率的特点,考虑了多层均压及圆周渡越时间后得到的闪络概率更能反映绝缘堆耐压水平;简化计算统计学经验公式中矩阵可保持绝缘堆闪络概率计算值准确性并减少过电压因子的静电场计算次数。分析在固定间隙距离下绝缘环个数与电压峰值及电场强度峰值的关系,计算结果表明:存在最优绝缘环个数承受最高电压峰值与电场强度,承受最大工作场强的绝缘环个数下,工作电压幅值已降低很多。在选择绝缘环个数时应综合考虑,该计算方法可应用于工程绝缘结构设计中合理选取绝缘环个数。
The statistical model is used as a typical method for vacuum insulator stack flashover probability calculation.We have calculated the stack flashover probability and the gfactors by which a flashover willchange the voltages on the each of the insulator rings with different conditions.The calculated results show that the real performance of insulator stack characteristics with the multi-stage and large circumferential transit time.The matrix ain the statistical model was predigested to reduce the gcalculation time and make the probability calculation accurate.Finally,analysis based on fixed distance between insulation rings showed that there were some optimized ring numbers with maximum voltage amplitude and electrical field amplitude.This conclusion could be used for evaluation of insulation ring number in insulator stack design.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2016年第4期95-99,共5页
High Power Laser and Particle Beams
基金
国家自然科学基金项目(51277168
51307155)
关键词
绝缘堆
闪络概率
统计学模型
圆周渡越时间
病态矩阵
insulator stack
flashover probability
statistical model
voltage distribution coefficient
ill-conditioned matrix
