摘要
太阳能电池硅片的质量是影响电池片转换效率以及电池组件发电效率的一个关键因素。硅片缺陷的存在会极大地降低电池片的发电效率,减少电池组件的使用寿命,甚至影响光伏发电系统的稳定性。通过对单晶硅片质量进行检测,分析少子寿命、早期光致衰减以及位错对太阳能电池性能的影响及解决方案。
The quality of solar cell silicon wafer is a key factor to affect the conversion efficiency of the battery and the power efficiency of the battery module. The existence of wafer defect can greatly reduce the power generation ef- ficiency, shorten the service life of the battery components, and even affect the stability of photovoltaic power gen- eration system. Based on the detection of single crystal silicon wafer, this paper also analyzed the effect of little sub life, early light induced attenuation and dislocation on solar cell and proposed solutions.
出处
《重庆科技学院学报(自然科学版)》
CAS
2016年第1期107-109,共3页
Journal of Chongqing University of Science and Technology:Natural Sciences Edition
基金
安徽省省级质量工程项目"光伏组件加工实训工学产合一教学模式的研究与实践"(2013JYXM429)
关键词
单晶硅
太阳能电池
转换效率
光致衰减
位错
single crystal silicon
solar cell
transfer efficiency
photoluminescence decay
dislocation