摘要
A stimulated emission depletion （STED） microscopy scheme using axially symmetric polarized vortex beams is pro- posed based on unique focusing properties of such kinds of beams. The concept of axially symmetric polarized vortex beams is first introduced, and the basic principle about the scheme is described. Simulation results for several typical beams are then shown, including radially polarized vortex beams, azimuthally polarized vortex beams, and high-order axi- ally symmetric polarized vortex beams. The results indicate that sharper doughnut spots and thus higher resolutions can be achieved, showing more flexibility than previous schemes based on flexible modulation of both phase and polarization for incident beams.
A stimulated emission depletion （STED） microscopy scheme using axially symmetric polarized vortex beams is pro- posed based on unique focusing properties of such kinds of beams. The concept of axially symmetric polarized vortex beams is first introduced, and the basic principle about the scheme is described. Simulation results for several typical beams are then shown, including radially polarized vortex beams, azimuthally polarized vortex beams, and high-order axi- ally symmetric polarized vortex beams. The results indicate that sharper doughnut spots and thus higher resolutions can be achieved, showing more flexibility than previous schemes based on flexible modulation of both phase and polarization for incident beams.
基金
Project supported by the National Natural Science Foundation of China(Grant Nos.61108047 and 61475021)
the Natural Science Foundation of Beijing,China(Grant No.4152015)
the Program for New Century Excellent Talents in Universities of China(Grant No.NCET-13-0667)
the Top Young Talents Support Program of Beijing
China(Grant No.CIT&TCD201404113)
