边界扫描JTAG控制器设计及实现

Design and Implementation of JTAG Controller Based on Boundary Scan

从边界扫描测试的概念、工作原理和基本结构入手,分析并设计了边界扫描JTAG控制器,以具体的芯片和指令为例,通过JTAG控制器实现了对芯片的边界扫描测试功能,为进一步展开嵌入式边界扫描测试研究工作提供了依据。

This paper is about the concept, operational theory and principal structure of Boundary Scan. The JTAG controller based on boundary scan is designed and implemented. According to the functional implementation of the JTAG controller based on boundary scan, a certain kind of chip and the corresponding instructions are taken as an example. The research result of this paper provides foundation to the future embedded boundary-scan test research work.