摘要
HT250材料目前在很多行业中有广泛的应用,为探究其在超声探伤中的衰减性,利用一组参数不同的直探头测定HT250和45钢的衰减系数。检测结果表明:1)HT250衰减系数大于45钢。2)探头频率和晶片尺寸均影响着衰减系数大小。开展模拟实验分析它们对衰减系数的影响,模拟结果表明:提高探头频率使衰减系数增大,频率越高增幅越大;探头晶片尺寸增大使衰减系数减小,且探头晶片尺寸对衰减系数影响弱于频率。
HT250 materials have been extensively applied in many industries lately. To explore their attenuation property in ultrasonic flaw detection, a group of normal probes with different parameters are used to measure the attenuation coefficient of HT250 and steel 45#. The testing results indicate:1)attenuation coefficients of HT250 are greater than those of steel 45#; 2)the attenuation coefficients are impacted by probe frequency and wafer size. Their influence on attenuation coefficient is analyzed through simulation tests. Simulation results show that the attenuation coefficient increases as probe frequency increases but reduces as the wafer size enlarges, and the wafer size has smaller effect on the attenuation coefficient than the probe frequency does.
出处
《中国测试》
CAS
北大核心
2016年第3期123-127,共5页
China Measurement & Test
基金
国家自然科学基金项目(50975287)
国家973计划项目(2011CB013405)