矩阵求逆应用于等离子体杂质体发射率测量的研究

Obtaining of Tokamak Plasma Impurities Emissivities Profiles by Using Matrix Inversion Method

对托卡马克等离子体中获得杂质局部体发射率的过程进行研究,提出了一种采用求逆矩阵的方法进行Abel反演,根据弦积分的杂质光亮度分布获得杂质局部体发射率。结合托卡马克装置假象的钼杂质弦积分剖面,采用该方法获得了杂质的体发射率分布。

In this paper,process of obtaining impurity emissivity on tokamak plasma has been studied. By using matrix inversion,emissivity can be calculated according to brightness of impurity spectral lines. As an example,Mo emissivities have been calculated by using this method based on the assumed brightness.