摘要
介绍了一种用于软X射线辐射能量测量的电阻式薄膜量热计。利用电流的欧姆热效应对薄膜量热计的灵敏度进行了标定。在有基底薄膜的标定过程中,采用一维热扩散模型,考虑了金属薄膜向基底的传导热损失。利用电阻式薄膜量热计对聚龙一号装置钨丝阵Z箍缩产生的软X射线进行了测量,并与平响应X射线二极管(XRD)探测器的测量结果进行了比较。实验结果表明,电阻式薄膜量热计测量的软X射线辐射能量和辐射功率与平响应XRD探测器结果在测量不确定度范围内合理地一致。
A resistive bolometer which is used to diagnose soft X-ray fluence is described.The bolometer is calibrated with Ohm heating.In the calibration scheme,heat loss into the substrate is considered with a simple one-dimensional heat conduction model.We utilize the bolometer to diagnose soft X-ray fluence of tungsten wire array Z-pinch experiments on PTS.Comparison of the bolometer measurements with a flat spectral response XRD(FSR-XRD)shows that the soft X-ray power and energy measurements from bolometers are reasonably consistent with that obtained by FSR-XRD.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2016年第7期145-150,共6页
High Power Laser and Particle Beams
基金
国家自然科学基金重点项目(10635050)
中国工程物理研究院脉冲功率重点实验室基金项目(PPLF2014PZ07
PPLF2013PZ10)